T1 E1 Testing
T1 E1, FXO FXS and Datacom Testing
T1/E1 carriers are used extensively throughout the world for carrying large volumes of call containing both voice and data. Their popularity can be attributed to their high reliability, manageability and flexibility. The available digitized channels, 24 for T1 and 32 for E1 can be used for carrying voice and/or data. Further, the carriers can be used separately, or they can be combined in order to provide higher transmission bandwidth.
Regardless of the form-factor you choose, GL’s T1/E1 Analyzers provide a wide range of functionalities and testing capabilities.
GL's Octal & Quad T1 E1 Analyzer Boards are high-density boards that provide Four (4) or Eight (8) RJ-48 T1 E1 ports and multiples thereof. With this, configurations of 8, 12, 16, ...64 T1 E1s in a single rack is possible. It's designed for the newer PCIe lanes for faster processing and scalability.
GL's Dual T1 E1 Express (PCIe) Boards are high-density dual T1 or E1 boards with newer PCIe (x1) bus interface. These cards are identical to the portable tProbe™ units, except for FXO FXS and Datacom functionality. In addition to the other basic T1/E1 line signals monitoring applications, the Dual T1 E1 Express (PCIe) Boards also support enhanced VF drop and insert capabilities with software selectable VF Tx and Rx impedances (135Ω, 150 Ω, 600 Ω, 900 Ω, or High), Pulse Mask Compliance Testing, Jitter Generation and Measurement applications.
GL's tScan16™ extends the family of GL’s T1/E1 platforms with greater density, increased ports, and reduced power. These boards along with a breakout-box provides 16 high-density T1/E1 ports and the newer PCIe (x1) bus interface. The sixteen T1/E1 ports are Receive-only ports optimized for high performance voice and data capture, monitoring, and analysis requirements.
The portable-compact USB-based T1 E1 Analyzer units support dual T1 or E1 ports and are highly portable and designed to be hosted by small computers (e.g. notebooks, laptops) making them especially convenient in the field.
The USB-based tProbe™ T1 E1 VF and Serial Data Analyzer units also support dual T1 or E1 ports and adds new functionality and features not available with the "portable" T1/E1 USB-based Analyzer. The enhanced features and capabilities include pulse mask and jitter measurement and analysis, cross-port through and transmit modes, enhanced VF drop and insert capabilities. Planned future expansion of the tProbe™ includes FXO RJ-11, FXS RJ-11 and dual DB25 connectors. Both types of analyzers sport features such as remote access, scripted control, and they can all support a vast array of optional applications.
The Dual Universal HD T1 E1 Analyzer Boards can be plugged into either a 5V or a 3.3V PCI bus. These newer generations of the dual T1 or E1 analyzer boards are faster, smaller, more efficient, and can process hundreds of channels or timeslots simultaneously when housed in modern PCs. PCI boards are the better choice when multiple analyzers are needed at a given location.
GL offers mTOP™ Rackmount and mTOP™ Probe T1 E1 test platforms. The mTOP™ rackmount is a 1U/2U rack enclosure within which multiple USB T1 E1 devices can be stacked to provide higher density form factor solution in a compact size. The mTOP™ Probe is an all-in-one self-contained test instrument within which a T1 E1 USB pod is combined with the PC interfaces within one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing. For more details on mTOP™ test platforms, refer to Test Tools in Rack Based and Stand-alone Platforms.
- Available in all types of platforms – PCI and PCIe boards, USB-based portable units, mTOP™ rackmount stacked with multiple devices, mTOP™ Probe stand-alone unit.
- Provides a scalable test solution for T1, E1, VF, and Datacom testing; Supports 2, 4, or 8 T1 or E1 ports, DTE and DCE interfaces, FXO, and FXS interfaces.
- Ability to monitor Power, Frequency, Signaling, Binary Byte Values, and DC Offset
- Time and spectral graphical views of any channel or timeslot can be monitored
- Internal speaker for DS0 Monitoring, Data, Four Wire VF-Interface, Drop and Insertion of Analog and Digital Signals, Real-time Monitor and Time-Stamped Log of all alarms and abnormal events
- Comprehensive Voice, Data, Protocol, Analog, Digital Analysis / Emulation
- Call Recording, Generation, and Monitoring for hundreds to thousands of calls in one platform
- tProbe™ units, Dual PCIe Express, and Universal T1/E1 boards supports Pulse mask, jitter generation and measurement
- Adjustable transmit clock frequency for testing frequency lock sensitivity of tProbe™ and Universal T1/E1 equipment
- Precision Delay Measurement, Unframed/Framed, Transmit/Receive Tone and signaling bits at user-defined frequency and power in one (or all) channels, and Tx/Rx loopback applications are provided for intrusive testing
- Supports Full/Fractional T1/E1 Bit Error Rate Testing with detailed logging
- Transmit Gaussian noise, Error Insertion capabilities
- A variety of “basic applications” and “special applications” are supported with T1 E1 cards
PC Based Cards
GL's Octal & Quad T1 E1 boards are high density and provide Four (4) or Eight (8) RJ-48 T1 E1 ports and multiples thereof. For example, configurations of 8, 12, 16, 64 T1 E1s in a single rack are possible.
GL's tScan16™ is a high-density T1 E1 board with 16 ports and the newer PCIe (x1) bus interface. The sixteen T1/E1 ports are Receive-only ports optimized for high performance voice and data capture, monitoring, and analysis requirements. tScan16 extends the family of GL’s T1 E1 platforms with greater density, increased ports, and reduced power.
GL's Dual T1 E1 Express (PCIe) Boards are high-density dual T1 or E1 boards with newer PCIe (x1) bus interface. These boards identical to the portable tProbe™ units, and support enhanced VF drop and insert capabilities with software selectable VF Tx and Rx impedances (135Ω, 150 Ω, 600 Ω, 900 Ω, or High), Pulse Mask Compliance Testing, Jitter Generation and Measurement applications.
USB Based Portable Units
tProbe™ is an enhanced version of our popular USB based T1 E1 VF Analyzer / Emulator. This hardware incorporates all the features of the previous analyzer such as portability, USB interface, remote accessibility, scripting, and a vast collection of optional applications.
USB based T1 E1 Analyzer is the world's most powerful, full featured, and complete BERT, voiceband, data, signaling, and protocol analyzer on the market. It can perform analysis and emulation of various signal types including voice, digits, and tones; various protocols including HDLC, ISDN, SS7, CAS, Frame Relay, GSM, GPRS, CDMA, and UMTS. It is capable of T1 or E1 PCM signal visualization, capture, storage, analysis, and emulation. In addition, convenient features are available like portability, USB friendly interface to a PC, remote accessi bility, and scripting.
The portable mTOP™ T1 E1 FXO FXS Probe unit includes GL’s USB based tProbe™ hardware unit with T1 E1 and FXO FXS interfaces along with the necessary PC interfaces within a single box for unified testing experience of TDM and Analog technologies.
GL’s T3/E3 analyzer unit used in conjunction with GL’s Laptop T1/E1 analyzer provides a complete T3/E3 (44.736/34.368 Mbps), T1/E1 (1.544 Mbps / 2.048Mbps), and DS0 (64Kbps) testing solution.
The T1 (or E1) Multiport Repeaters generate multiple identical T1 (or E1) outputs for each T1 (or E1) input. The repeaters are ideal for multicast (broadcast) applications and in lab environments for load testing and signal duplication purposes.
mTOP™ Rackmount - tProbe™ T1 E1 FXO FXS Tester
mTOP™ FXO FXS rack enclosure is a sleek 1U appliance housing GL’s USB basedT1 E1 and FXO FXS hardware units for unified testing experience of TDM and Analog technologies.
The FXO port on the mTOP™ Tester rack unit permits non-intrusive capture and analysis of voice-band signals from a two-wire telephone line. The FXS port emulates a two-wire FXS service such as a telephone wall jack. The T1 E1 board on the rack monitors the T1 E1 line conditions such as frame errors, violations, alarms, frequency, power level, and clock (or frame/bit) slips. Comprehensive Analysis / Emulation of Voice, Data, Fax, Protocol, Analog, and Digital signals, including Echo and Voice Quality testing.
mTOP™ Rackmount - T1/E1, and T3/E3 Testers
GL’s rack based Channelized T3E3 Analyzer, supports T3E3 and T1E1 Multi-interface. A T3 (DS3) consists of a total of 28 T1s, or 672 full duplex voice channels. Similarly, an E3 consists of a total of 16 E1s, or 480 full duplex voice channels.
Almost all of GL’s T1 E1 Testers can be accommodated into rack-based units. A customized 2U rack tProbe™ T1 E1 / Datacom-Analog units, to serve the purpose of handling multiple communications lines and test complex functionalities.
The T1 E1 J1 Switch provides non-intrusive failsafe monitoring and intrusive test and diagnostic capability for up to 8 full duplex T1, E1, and J1 lines. The unit provides two RJ-48c connectors for a thru connection for equipment and line connections and a Rj-48c monitor connector for monitoring both directions of a full duplex high speed line. The switch can be remotely controlled via a USB connection. GUI and scripted control software is available for placing the switch in various modes for monitoring and diagnostic purposes.
Almost all of GL’s T1 E1 Testers can be accommodated into rack based units. A typical 1U rack mount Quad T1 Tester system is as shown in the figure. Similarly, a customized 2U rack can accommodate up to 3x tProbe™-T1 E1 -Datacom-Analog units, to serve the purpose of handling multiple communications lines and test complex functionalities.
T3 T1 or E3 E1 Multi-Tester Rack Mount
GL’s rack based Channelized T3E3 Analyzer supports 6 T3s (6 * 672 DS0s). Multiple rack units can be stacked together for greater scalability. A T3 (DS3) consists of a total of 28 T1s, or 672 full duplex voice channel. Similarly, an E3 consists of a total of 16 E1s, or 480 full duplex voice channels.Almost all of GL’s T1 E1 Testers can be accommodated into rack based units. A customized 2U rack tProbe™-T1 E1 / Datacom-Analog units, to serve the purpose of handling multiple communications lines and test complex functionalities.
LinkTest™ Dual E1 - E1, Datacom, Jitter, Wander Testing
GL's LinkTest™ Dual E1 is a handheld dual-port tester for E1 and data communications (V.11 / X.24, V.24/RS232, V.35, V.36/RS449, EIA-530, EIA-530A) interfaces. With the support of a large range of software options for E1 services and sub rate multiplexing system, this handheld unit provides a scalable test solution for E1 and data testing. It provides a large, clear screen with a full set of physical layer tests for E1 balanced and unbalanced circuits including BERT, VF, round trip delay and signal level.