GL Communications Inc.
 
 
 
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LinkTest™ Single+


Overview

The GLís LinkTest™ SINGLE+ is a sophisticated bit error rate tester in a compact, hand held package. The unit can test a wide variety of communications facilities and equipment including DDS, T1, fractional T1, E1, fractional E1, T3and E3NTUs, multiplexers, CSU/DSUs, T1 CSUs, DTUs and TIUs.

 
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Main Features

  • Tests asynchronous, synchronous, DDS, T1 and fractional T1, E1 and fractional E1, T3 E3 facilities and equipment
  • Interfaces V.35, RS232, RS422/RS530, X.21, HSSI, DDS, T1 E1, T3 E3
  • Data rates from 50 bps to 50 Mbps
  • Displays G.821 performance measurements
  • Built-in speaker for monitoring DS0s or timeslots
  • Controlled from the Front panel, Windows GUI or Command Line Interface
  • Works with AC or battery power

Applications

LinkTest™ SINGLE+ is designed to fulfill the requirements of a broad range of applications that may be used to test data communications equipment, networks, systems and line facilities. It simulates real data passing through a data communications link, and then determines the performance of a piece of equipment or that of a network. Many standard data patterns may be generated and recovered. The LinkTest™ SINGLE+ can then monitor the data passing through the data communications link, and indicate line quality by comparing the data that has been received with the data that was known to have been transmitted.

Typical applications include,

  • Final test departments
  • Field installations of data communications equipment
  • Field evaluations of data communications equipment
  • Field monitoring of data communications facilities
  • Field problem isolation

LinkTest™ SINGLE+ can test:

  • Async Mode - Tests asynchronous modems and CRT terminals
  • Sync Mode - Tests the customer interface on DDS, T1 and T3 CSU/DSUs, mux channels and synchronous modems
  • DDS Mode - Simulates a DDS CSU/DSU to test a DDS line or emulates a central office to test DDS CSU/DSUs
  • T1Mode - Tests T1 lines, CSU/DSUs both short and long haul, T1 mux and drops from T3 mux
  • E1Mode - Tests E1 lines, NTUs and DTUs, E1 mux and drops from T3 E3 mux
  • T3Mode - Tests T3 lines and mux and T1 E1 channels on T3 facilities
  • E3Mode - Tests E3 lines and mux

T1 and E1 Testing

In the T1and E1 modes, the tester displays bit errors, transmit and receive frequency, test seconds, bit error rate, and G.821 performance measurements (erred seconds, severely erred seconds, degraded minutes and available and unavailable times). A variety of test patterns can be inserted in all or selected DS0s/timeslots, continuous or non-contiguous, making the tester ideal for fractional T1 E1 testing. In the T1 mode, it also displays RX level in db and volts.

T3 and E3 Testing

The LinkTest™ SINGLE+ can test T3and E3networks and CSUs. It performs G.821 measurements and displays bit errors, bit error rate, frequency and more.

Asynchronous and Synchronous Testing

In addition to T1 and E1, the LinkTest™ SINGLE+ provides asynchronous and synchronous test modes.

  • Generates test data in a choice of patterns and formats
  • Users can choose from twenty-eight async and seventy-five sync test speeds
  • Displays bit errors, bit error rate, and total test seconds
  • In the async mode, it also displays characters received, character errors and erred seconds
  • In the sync mode, it also displays TX frequency, RX frequency, CTS delay, G.821 measurements and more

DDS Testing

The tester also includes a DDS analyzer. It can operate at speeds from 2400 to 72,000 bps in normal and secondary channel modes. It can simulate a CSU/DSU to test networks or a network to test CSU/DSUs


Specifications



Async
Speeds 50 to 115,000 bps
Displays Character Errors, Characters Received, Total Test Seconds, Erred Seconds, Round Trip Delay, and Elapsed Time
LEDS Pattern Lock, Pattern Recovered, TXD, RXD, RTS, CTS, DSR, CD, and DTR
Patterns 2^9 (511), 2^11 (2047), Binary, Fox Test, Mark and Space, Round Trip Delay
Loops Self-Test
Interfaces V.35, RS530, RS422 and RS232 Physical: DB 25 pin Female


Sync
Speeds 1,200 to 50,000,000 bps
Displays Bit Errors, Bit Error Rate, Test Secs, Erred Secs, Severely Erred Secs, Degraded Mins, Available, Unavailable, RX Freq, TX Freq, Bits Received, RTS Time, Round Trip Delay, and Elapsed Time
LEDS Pattern Lock, Pattern Recovered, Transmit Data, Receive Data, RTS (C), CTS, DSR, CD (I), DTR, TXC, RXC (S), and External TXC
Patterns 2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20, 2^23, ITU 2^23, 1 of 8, 3 of 24, Alt, Mark and Space, Round Trip Delay, and User 3 - 32
Loops Self-Test and V.54
Interfaces V.35/DB25, RS530/DB25, RS422/DB25, RS232/DB25, X.21/DB15 and HSSI/50 pin


DDS
Speeds 2,400 to 72,000 bps
Displays Bit Errors, Bit Error Rate, Test Secs, Erred Secs, , Secondary Errors, Severely Erred Secs, Degraded Mins, Available, Unavailable, RX Freq, TX Freq, Bits, RX Level dB, Simplex Current, Round Trip Delay and RLOS Secs
LEDS Pattern Lock, Pattern Recovered, CMI (IDLE), All 1s, All 0s, RLOS, OOF, OOS, CSU Loop, DSU Loop and V.54 Loop
Patterns 2^9 (511), 2^11 (2047), 2^15, QRSS, 1 of 8, 3 of 24, Alt, Mark, Space, DDS1, DDS2, DDS3, DDS4, Round Trip Delay and User 3 - 32
Loops Self-Test, CSU Loop, DSU Loop and V.54 Loop
Interfaces Four wire, BiPolar Physical: RJ48S


T1
Speeds 1,544,000 bps
Displays Bit Errors, Bit Error Rate, Test Secs, Erred Secs, Severely Erred Secs, Degraded Mins, Available, Unavailable, RX Freq, TX Freq, Signaling Bits, Density Errors, Frame Errors, CRC Error, BPV Error, RX Level Volts & dB, Slips, Round Trip Delay
LEDS Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS, CRC Error, BPV, D4, ESF, AMI, B8ZS and Yellow
Patterns 2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20, 2^23, ITU 2^23, 1 of 8, 3 of 24, T1 DALY, T1 DALY UF, 55 Octet, 55 Octet UF, Alt, Mark, Space, Digimwatt, User 3 - 32, Round Trip Delay, DDS OCU Loop, DDS CSU Loop and DDS DSU Loop
Loops Self-Test, ATT Loop U/D, ANSI Loop U/D, ATT Payload, ANSI Payload, Smart Jack 1 & 2 (Framed & Unframed) and V.54
Interfaces DS1 BiPolar, 110 Ohm, AMI/B8ZS Coding Physical: RJ48C and Dual Bantam


E1
Speeds 2,048,000 bps
Displays Bit Errors, Bit Error Rate, Test Secs, Erred Secs, Severely Erred Secs, Degraded Mins, Available, Unavailable, RX Freq, TX Freq, CRC Errors, BPV Errors and Frame Errors
LEDS Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS, CRC Error, BPV, DMFA and RRA
Patterns 2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20, 2^23, ITU 2^23, 1 of 8, 3 of 24, Alt, Mark, Space, Digimwatt and User 3 - 32
Loops Self-Test and V.54
Interfaces G.703/704, 75 & 120 Ohm, HDB3 Coding Physical: Dual Bantam, Dual BNC and RJ48C


T-3
Speeds 44,736,000 bps
Displays Bit Errors, Bit Error Rate, Test Secs, Erred Secs, Severely Erred Secs, Degraded Mins, Available, Unavailable, RX Freq, TX Freq, P-Bit Errors, C-Bit Errors, T3 & T2 Frame Errors, LCV Error, FEBE Error, Excessive 0s and LOS Secs
LEDS Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS, LOF, LCV, FEBE, Yellow, M13 and C-Bit
Patterns 2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20, 2^23, ITU 2^23, 1111, IDLE 1100, AIS 1010, 0000, 1 of 8 and User 3 - 32
Loops Self-Test and CSU
Interfaces DS3 BiPolar, 75 Ohm Physical: Dual Mini WECo 560A


E-3
Speeds 34,368,000 bps
Displays Bit Errors, Bit Error Rate, Test Secs, Erred Secs, Severely Erred Secs, Degraded Mins, Available, Unavailable, RX Freq, TX Freq, LCVs, LOS Secs and Frame Errors
LEDS Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS, LOF, BPV, and RAI
Patterns 2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20, 2^23, ITU 2^23, 1 of 8, Alt, Mark, Space and User 3 - 32
Loops Self-Test and LINE
Interfaces G.703/751, 75 Ohm, HDB3 Coding Physical: Dual Mini WECo 560A


Physical Dimensions
Dimension 8.75" (22.2 cm) h x 7.5" (19.1 cm) w x 4" (10.2 cm) d
Weight 4.4 lbs (1.81 kg)

Specifications subject to change without notice.


Application Notes


Buyer's Guide

Item No. Item Description
LTS002 LinkTest™ SINGLE+
Portable Single T1 E1, T3 E3 Test Set
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