|
Home
>
Analysis (T1/E1/T3/E3/OC-3/OC-12/STM-1/STM-4)
>
Hand Portable Test Instruments
Overview
The GL’s LinkTest™ SINGLE+ is a sophisticated bit error rate tester in a compact, hand held package. The unit can
test a wide variety of communications facilities and equipment including DDS, T1, fractional T1, E1, fractional E1, T3and
E3NTUs, multiplexers, CSU/DSUs, T1 CSUs, DTUs and TIUs.
Main Features
- Tests asynchronous, synchronous, DDS, T1 and fractional T1, E1 and fractional E1, T3 E3 facilities and equipment
- Interfaces V.35, RS232, RS422/RS530, X.21, HSSI, DDS, T1 E1, T3 E3
- Data rates from 50 bps to 50 Mbps
- Displays G.821 performance measurements
- Built-in speaker for monitoring DS0s or timeslots
- Controlled from the Front panel, Windows GUI or Command Line Interface
- Works with AC or battery power
Applications
LinkTest™ SINGLE+ is designed to fulfill the requirements of a broad range of applications that may be used to
test data communications equipment, networks, systems and line facilities. It simulates real data passing through a data
communications link, and then determines the performance of a piece of equipment or that of a network. Many standard
data patterns may be generated and recovered. The LinkTest™ SINGLE+ can then monitor the data passing through
the data communications link, and indicate line quality by comparing the data that has been received with the data that
was known to have been transmitted.
Typical applications include,
- Final test departments
- Field installations of data communications equipment,
- Field evaluations of data communications equipment,
- Field monitoring of data communications facilities
- Field problem isolation
LinkTest™ SINGLE+ can test:
- Async Mode - Tests asynchronous modems and CRT terminals
- Sync Mode - Tests the customer interface on DDS, T1 and T3 CSU/DSUs, mux channels and synchronous modems.
- DDS Mode - Simulates a DDS CSU/DSU to test a DDS line or emulates a central office to test DDS CSU/DSUs
- T1Mode - Tests T1 lines, CSU/DSUs both short and long haul, T1 mux and drops from T3 mux
- E1Mode - Tests E1 lines, NTUs and DTUs, E1 mux and drops from T3 E3 mux
- T3Mode - Tests T3 lines and mux and T1 E1 channels on T3 facilities
- E3Mode - Tests E3 lines and mux
T1 and E1 Testing
In the T1and E1 modes, the tester displays bit errors, transmit and receive frequency, test seconds, bit error rate, and
G.821 performance measurements (erred seconds, severely erred seconds, degraded minutes and available and unavailable
times). A variety of test patterns can be inserted in all or selected DS0s/timeslots, continuous or non-contiguous, making the
tester ideal for fractional T1 E1 testing. In the T1 mode, it also displays RX level in db and volts.
T3 and E3 Testing
The LinkTest™ SINGLE+ can test T3and E3networks and CSUs. It performs G.821 measurements and displays
bit errors, bit error rate, frequency and more.
Asynchronous and Synchronous Testing
In addition to T1 and E1, the LinkTest™ SINGLE+ provides asynchronous and synchronous test modes.
- Generates test data in a choice of patterns and formats
- Users can choose from twenty-eight async and seventy-five sync test speeds
- Displays bit errors, bit error rate, and total test seconds
- In the async mode, it also displays characters received, character errors and erred seconds
- In the sync mode, it also displays TX frequency, RX frequency, CTS delay, G.821 measurements and more
DDS Testing
The tester also includes a DDS analyzer. It can operate at speeds from 2400 to 72,000 bps in normal and secondary
channel modes. It can simulate a CSU/DSU to test networks or a network to test CSU/DSUs
Specifications
Async
| Speeds |
50 to 115,000 bps |
| Displays |
Character Errors, Characters Received, Total Test Seconds and Erred Seconds |
| LEDS |
Pattern Lock, Pattern Recovered, TXD, RXD, RTS, CTS, DSR, CD, and DTR |
| Patterns |
2^9 (511), 2^11 (2047), Binary, Fox Test, Mark and Space |
| Loops |
Self-Test |
| Interfaces |
V.35, RS530, RS422 and RS232 Physical: DB 25 pin Female |
Sync
| Speeds |
1,200 to 50,000,000 bps |
| Displays |
Bit Errors, Bit Error Rate, Test Secs, Erred Secs, Severely Erred Secs, Degraded Mins, Available,
Unavailable, RX Freq, TX Freq, Bits Received, RTS Time, Round Trip Delay |
| LEDS |
Pattern Lock, Pattern Recovered, Transmit Data, Receive Data, RTS (C), CTS, DSR, CD (I), DTR, TXC,
RXC (S), and External TXC |
| Patterns |
2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20, 2^23, ITU 2^23, 1 of 8, 3 of 24, Alt,
Mark, Space, Round Trip Delay and User 3 - 32 |
| Loops |
Self-Test and V.54 |
| Interfaces |
V.35/DB25, RS530/DB25, RS422/DB25, RS232/DB25, X.21/DB15 and HSSI/50 pin |
DDS
| Speeds |
2,400 to 72,000 bps |
| Displays |
Bit Errors, Bit Error Rate, Test Secs, Erred Secs, , Secondary Errors, Severely Erred Secs, Degraded
Mins, Available, Unavailable, RX Freq, TX Freq, Bits, RX Level dB, Simplex Current, Round Trip Delay and RLOS Secs |
| LEDS |
Pattern Lock, Pattern Recovered, CMI (IDLE), All 1s, All 0s, RLOS, OOF, OOS, CSU Loop, DSU Loop
and V.54 Loop |
| Patterns |
2^9 (511), 2^11 (2047), 2^15, QRSS, 1 of 8, 3 of 24, Alt, Mark, Space, DDS1, DDS2, DDS3, DDS4,
Round Trip Delay and User 3 - 32 |
| Loops |
Self-Test, CSU Loop, DSU Loop and V.54 Loop |
| Interfaces |
Four wire, BiPolar Physical: RJ48S |
T1
| Speeds |
1,544,000 bps |
| Displays |
Bit Errors, Bit Error Rate, Test Secs, Erred Secs, Severely Erred Secs, Degraded Mins, Available,
Unavailable, RX Freq, TX Freq, Signaling Bits, Density Errors, Frame Errors, CRC Error, BPV Error, RX Level Volts & dB,
Slips, Round Trip Delay |
| LEDS |
Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS, CRC Error, BPV, D4, ESF, AMI, B8ZS
and Yellow |
| Patterns |
2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20, 2^23, ITU 2^23, 1 of 8, 3 of 24,
T1 DALY, T1 DALY UF, 55 Octet, 55 Octet UF, Alt, Mark, Space, Digimwatt, User 3 - 32, Round Trip Delay, DDS OCU
Loop, DDS CSU Loop and DDS DSU Loop |
| Loops |
Self-Test, ATT Loop U/D, ANSI Loop U/D, ATT Payload, ANSI Payload, Smart Jack 1 & 2 (Framed &
Unframed) and V.54 |
| Interfaces |
DS1 BiPolar, 110 Ohm, AMI/B8ZS Coding Physical: RJ48C and Dual Bantam |
E1
| Speeds |
2,048,000 bps |
| Displays |
Bit Errors, Bit Error Rate, Test Secs, Erred Secs, Severely Erred Secs, Degraded Mins, Available,
Unavailable, RX Freq, TX Freq, CRC Errors, BPV Errors and Frame Errors |
| LEDS |
Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS, CRC Error, BPV, DMFA and RRA |
| Patterns |
2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20, 2^23, ITU 2^23, 1 of 8,
3 of 24, Alt, Mark, Space, Digimwatt and User 3 - 32 |
| Loops |
Self-Test and V.54 |
| Interfaces |
G.703/704, 75 & 120 Ohm, HDB3 Coding Physical: Dual Bantam, Dual BNC and RJ48C |
T-3
| Speeds |
44,736,000 bps |
| Displays |
Bit Errors, Bit Error Rate, Test Secs, Erred Secs, Severely Erred Secs, Degraded Mins, Available,
Unavailable, RX Freq, TX Freq, P-Bit Errors, C-Bit Errors, T3 & T2 Frame Errors, LCV Error, FEBE Error, Excessive 0s
and LOS Secs |
| LEDS |
Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS, LOF, LCV, FEBE, Yellow, M13 and C-Bit |
| Patterns |
2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20, 2^23, ITU 2^23, 1111, IDLE 1100,
AIS 1010, 0000, 1 of 8 and User 3 - 32 |
| Loops |
Self-Test and CSU |
| Interfaces |
DS3 BiPolar, 75 Ohm Physical: Dual Mini WECo 560A |
E-3
| Speeds |
34,368,000 bps |
| Displays |
Bit Errors, Bit Error Rate, Test Secs, Erred Secs, Severely Erred Secs, Degraded Mins, Available,
Unavailable, RX Freq, TX Freq, LCVs, LOS Secs and Frame Errors |
| LEDS |
Pattern Lock, Pattern Recovered, Frame Lock, AIS (Blue), RLOS, LOF, BPV, and RAI |
| Patterns |
2^9 (511), 2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20, 2^23, ITU 2^23, 1 of 8, Alt,
Mark, Space and User 3 - 32 |
| Loops |
Self-Test and LINE |
| Interfaces |
G.703/751, 75 Ohm, HDB3 Coding Physical: Dual Mini WECo 560A |
Physical Dimensions
| Dimension |
8.75" (22.2 cm) h x 7.5" (19.1 cm) w x 4" (10.2 cm) d |
| Weight |
4.4 lbs (1.81 kg) |
Specifications subject to change without notice.
Application Notes
Buyer's Guide
|
