Overview
There are two methods for automated testing of voice enhancement devices, they are:
File Based Approach - This method transmits files to Sin and Rin of the VED and captures responses at Sout and Rout.
With this method, the Sin is pre-created from the Rin signal. This method assumes that Rout is identical to Rin. This works perfectly
for TDM based Line Voice Enhancement Devices. This could also be used to test VEDs within Gateways in VoIP or VoATM
environments as long as the delay between gateways is constant and Rout=Rin is valid. When testing VEDs within Gateways, a
configuration of back-to-back Gateways is necessary to access the TDM side of each Gateway.
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Real-Time Approach - This method creates Sin in real-time from the Rout. It is applicable to both TDM, VoiP, and VoATM
Networks. Windows Client Server (WCS) Software is used to perform real-time functions. Diagrams for both are depicted below.
The Auto VED Test Software is a feature rich application that uses GL Communications' T1/E1 Analyzer products to perform
Automated Voice Enhancement Device testing in accordance with G.160 and G.169 ITU test requirements.
As discussed above, two methods may be used to generate/capture stimulus and response signals from the VED. In the File
Based approach, Rin and Sin files are prepared by Auto VED Test software and then applied to the VED. In the Real-Time approach,
the Sin signal is created in real-time from Rout. In either case, users are permitted to set:
ITU-T G.160 and G.169 tests
Test 1.1 Signaling tones tests
Test 2.1 Noise reduction signal level tests
GL's advanced VED test designs
Receive path voice improvement tests
Send path noise compensation tests
Receive path ALC tests
Send path ALC tests
Send path EVI (enhanced voice intelligibility) tests.
The setup parameters for those tests are:
- Framing format (D4 and ESF for T1, CAS and CCS for E1)
- Timeslots
- Levels for pseudo speech/noise
- Levels for noise
- Frequency for the signaling tones test
- Noise reduction function triggering parameters (triggering signal types, power levels, durations, etc.)
The software applies the Rin and Sin simultaneously to the VED under test and captures the Sout/Rout (the output of VEDs)
signal for analysis.
Rout and Sout files are captured and automatically assessed. Graphical and tabular data is provided for all tests for easy
interpretation. Objective test results are displayed. User can zoom-in on any test result to further investigate. The detailed
graphical analysis of tests are also a click away to gauge overall performance of the VEDs.
Main Features:
- MS-Windows OS (Win 2000 or NT) with User-Friendly Graphical User Interface
- Compatible with GL's well proven UltraT1/E1 PCI Cards or Laptop T1/E1 Portables
- Real-time as well as off-line analysis
- Auto analysis of the response according to G.160 and G.169 requirement
- Tabular Pass/Fail Results
- Detailed graphical results for individual test, overall test.
VED Test System:
One Dual PCI Ultra T1 or E1 Card or Two Single PCI Ultra T1 or E1 Cards with digital and analog inputs and outputs are used.
Alternatively, GL's Dual Laptop T1 or E1 Analyzer can be used for convenience and portability. Digital inputs and outputs are used
to interface to T1/E1 lines of the EC under test.
Sample Screenshots
Buyer's Guide
Please Note: The XX in the Item No. refers to the hardware platform, listed at the bottom of the Buyer's Guide,
which the software will be running on. Therefore, XX can either be HDT, HDE, HUT, HUE, UTA or UEA depending
upon the hardware.
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